Scanning Probe Microscope based Tools for Nano Technology

The new form of PIV--nano-particle image velocimetry (nPIV)--based on total internal reflection fluorescence (TIRF), or evanescent-wave fluorescence, to study flows in the interfacial region next to the channel wall with a spatial resolution normal to the wall of 100-300 nm.

Scanning Probe Microscope based Tools for Nano Technology

Postby arunraje on Tue Jun 17, 2008 4:50 pm

Scanning Probe Microscope based Tools for Nano Technology

http://www.ntmdt.com/Application-Notes/index.html
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